Degradation and breakdown characteristics of thin MgO dielectric layers
نویسندگان
چکیده
منابع مشابه
Thickness and dielectric constant determination of thin dielectric layers
We derive a method for the determination of the dielectric constant and thickness of a thin dielectric layer, deposited on top of a thick dielectric layer which is in turn present on a metal film. Reflection of pand s-polarlzed light from the metal layer yields minima for certain angles of incidence where the light is absorbed by the metal. The thin dielectric layer causes shifts in the angles ...
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J. Ronald V. Zaneveld College of Oceanic and Atmospheric Sciences Ocean. Admin. Bldg. 104 Oregon State University Corvallis, OR 97331-5503 Phone: (541) 737-3571 fax: (541) 737-2064 email: [email protected] W. Scott Pegau College of Oceanic and Atmospheric Sciences Ocean. Admin. Bldg. 104 Oregon State University Corvallis, OR 97331-5503 Phone: (541) 737-5229 fax: (541) 737-2064 email: spegau...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2010
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.3265434